Dr James Wesley-Smith
Manager of Characterisation Facility |
Ms Sharon Eggers
Characterisation of materials using primarily SEM, EDX, AFM and XRD |
Dr Thomas Malwela
Milling and Imaging using Focused-Ion Beam Scanning Electron Microscope, Atomic Force Microscopy |
Technician: Ms Charity Maepa
Scanning Electron Microscopy with EDS |
Technician: Ms Getrude Makgatho
Technician: Polymer Characterisation instrumentation |
Intern: Ms Rirhandzu Rikhotso
Transmission Electron Microscopy |